AN79N00AN79N00, Serwisówki TV, Układy Scalone
[ Pobierz całość w formacie PDF ]
Voltage Regulators AN79Nxx Series 3-pin negative output voltage regulator (300 mA type) Overview The AN79Nxx series is a 3-pin, fixed negative output type monolithic voltage regulator. Stabilized fixed output voltage is obtained from unstable DC input voltage with- out using any external component IC. 12 types of output voltage are available: −4V, −5V, −6V, −7V, −8V, −9V, − 10V, −12V, −15V, −18V, −20V and −24V. They can be used widely in power circuits with current capacity of up to 300mA. AN79Nxx series Unit : mm 8.0 3.05 Features • No external components • Output voltage: −4V, −5V, −6V, −7V, −8V, −9V,−10V, −12V, −15V, −18V, −20V, −24V • Built-in overcurrent limit circuit • Built-in thermal overload protection circuit • Built-in ASO (area of safe operation) protection circuit 0.75±0.25 0.5±0.1 0.5±0.25 2.3 1.44 1.76 4.6 123 1 : Common 2 : Input 3 : Output SSIP003-P-0000E Block Diagram 1 Common + R 1 Voltage Reference Error Amp. − R 2 3 Output Starter Q 1 Thermal Protection Current Limiter Pass Tr R SC 2 Input 1 +0.5 –0.1 AN79Nxx Series Voltage Regulators Absolute Maximum Ratings at T a = 25 ° C Parameter Symbol Rating Unit Input voltage V I − 35 * 1 V V W °C °C 40 * 2 8 * 3 −20 to +80 − − Power dissipation Operating ambient temperature Storage temperature * 1 AN79N04, AN79N05, AN79N06, AN79N07, AN79N08, AN79N09, AN79N10, AN79N12, AN79N15, AN79N18 * 2 AN79N20, AN79N24 * 3 Follow the derating curve. When T j exceeds 150°C, the internal circuit cuts off the output. P D T opr T stg 55 to + 150 Electrical Characteristics at T a = 25 ° C • AN79N04 ( − 4V type) Parameter Symbol Conditions Min Typ Max Unit Output voltage V O T j = 25 ° C − 3.84 − − 4 − 4.16 V Output voltage tolerance V O V I = − 6 to − 25V, I O = 5 to 200mA 3.8 − 4.2 V Line regulation REG IN V I = −6 to −25V, T j = 25°C 9 40 mV V I = −7 to −17V, T j = 25°C 4 20 mV Load regulation REG L I O = 1 to 300mA, T j = 25°C 20 80 40 5 mV I O = 5 to 200mA, T j = 25°C 10 mV Bias current I Bias T j = 25°C 3 mA Bias current fluctuation to input ∆I Bias(IN) V I = −7 to −25V, T j = 25°C 0.5 0.1 mA Bias current fluctuation to load ∆I Bias(L) I O = 5 to 200mA, T j = 25°C mA Output noise voltage V no f = 10Hz to 100kHz 100 µV Ripple rejection ratio RR V I = − 7 to − 17V, I O = 50mA, 60 dB f = 120Hz Minimum input/output voltage difference V DIF(min) I O = 200mA, T j = 25°C 1.1 V Output short-circuit current I O(Short) V I = −35V, T j = 25°C 10 mA Peak output current I O(Peak) T j = 25°C 500 mA Output voltage temperature coefficient ∆V O /T a I O = 5mA − 0.4 mV/°C Note 1) The specified condition T j = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, V I = −9V, I O = 100mA, C I = 2µF, C O = 1µF and T j = 0 to 125°C 2 Voltage Regulators AN79Nxx Series Electrical Characteristics at T a = 25 ° C (continued) • AN79N05 ( − 5V type) Parameter Symbol Conditions Min Typ Max Unit Output voltage Output voltage tolerance V O T j = 25°C −4.8 −4.75 −5 −5.2 V V O V I = −7 to −25V, I O = 5 to 200mA −5.25 V Line regulation REG IN V I = − 7 to − 25V, T j = 25 ° C 10 50 mV V I = − 8 to − 18V, T j = 25 ° C 5 30 mV Load regulation REG L I O = 1 to 300mA, T j = 25°C 20 100 50 5 mV I O = 5 to 200mA, T j = 25°C 10 mV Bias current Bias current fluctuation to input Bias current fluctuation to load Output noise voltage I Bias T j = 25°C 3 mA ∆I Bias(IN) V I = −8 to −25V, T j = 25°C 0.5 0.1 mA ∆I Bias(L) I O = 5 to 200mA, T j = 25°C mA V no f = 10Hz to 100kHz 125 µV Ripple rejection ratio RR V I = −8 to −18V, I O = 50mA, f = 120Hz 60 dB Minimum input/output voltage difference Output short-circuit current Peak output current Output voltage temperature coefficient V DIF(min) I O = 200mA, T j = 25°C 1.1 10 500 V I O(Short) V I = −35V, T j = 25°C mA I O(Peak) T j = 25°C mA ∆V O /T a I O = 5mA − 0.4 mV/°C Note 1) The specified condition T j = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, V I = −10V, I O = 100mA, C I = 2µF, C O = 1µF and T j = 0 to 125°C • AN79N06 ( − 6V type) Parameter Symbol Conditions Min Typ Max Unit Output voltage Output voltage tolerance V O T j = 25°C −5.75 −5.7 −6 −6.25 V V O V I = −8 to −25V, I O = 5 to 200mA −6.3 V Line regulation REG IN V I = − 8 to − 25V, T j = 25 ° C 11 60 mV V I = − 9 to − 19V, T j = 25 ° C 6 40 mV Load regulation REG L I O = 1 to 300mA, T j = 25°C 20 120 60 5 mV I O = 5 to 200mA, T j = 25°C 10 mV Bias current Bias current fluctuation to input Bias current fluctuation to load Output noise voltage I Bias T j = 25°C 3 mA ∆ I Bias(IN) V I = −9 to −25V, T j = 25°C 0.5 0.1 mA ∆ I Bias(L) I O = 5 to 200mA, T j = 25°C mA V no f = 10Hz to 100kHz 150 µV Ripple rejection ratio RR V I = −9 to −19V, I O = 50mA, f = 120Hz 60 dB Minimum input/output voltage difference Output short-circuit current Peak output current Output voltage temperature coefficient V DIF(min) I O = 5mA, T j = 0 to 125°C 1.1 10 500 V I O(Short) V I = −35V, T j = 25°C mA I O(Peak) T j = 25°C mA ∆V O /T a I O = 200mA − 0.4 mV/°C Note 1) The specified condition T j = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, V I = −11V, I O = 100mA, C I = 2µF, C O = 1µF and T j = 0 to 125°C 3 AN79Nxx Series Voltage Regulators Electrical Characteristics at T a = 25 ° C (continued) • AN79N07 ( − 7V type) Parameter Symbol Conditions Min Typ Max Unit Output voltage Output voltage tolerance V O T j = 25°C −6.7 −6.65 −7 −7.3 V V O V I = −9 to −25V, I O = 5 to 200mA −7.35 V Line regulation REG IN V I = −9 to −25V, T j = 25°C 12 70 mV V I = −10 to −20V, T j = 25°C 7 35 mV Load regulation I O = 1 to 300mA, T j = 25 ° C 20 140 70 5 mV REG L I O = 5 to 200mA, T j = 25 ° C 10 mV Bias current Bias current fluctuation to input Bias current fluctuation to load Output noise voltage I Bias T j = 25 ° C 3 mA ∆ I Bias(IN) V I = − 10 to − 25V, T j = 25 ° C 0.5 0.1 mA ∆ I Bias(L) I O = 5 to 200mA, T j = 25 ° C mA V no f = 10Hz to 100kHz 175 µ V Ripple rejection ratio RR V I = −10 to −20V, I O = 50mA, f = 120Hz 59 dB Minimum input/output voltage difference Output short-circuit current Peak output current Output voltage temperature coefficient V DIF(min) I O = 200mA, T j = 25°C 1.1 10 500 V I O(Short) V I = − 35V, T j = 25 ° C mA I O(Peak) T j = 25 ° C mA ∆ V O /T a I O = 5mA − 0.5 mV/ ° C C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, V I = 25 ° = − 12V, I O = 100mA, C I = 2 µ F, C O = 1 µ F and T j = 0 to 125 ° C • AN79N08 ( − 8V type) Parameter Symbol Conditions Min Typ Max Unit Output voltage Output voltage tolerance V O T j = 25 ° C −7.7 − −8 −8.3 V V O V I = − 10.5 to − 25V, I O = 5 to 200mA 7.6 − 8.4 V Line regulation REG IN V I = −10.5 to −25V, T j = 25°C 13 80 mV V I = −11 to −21V, T j = 25°C 8 40 mV Load regulation REG L I O = 1 to 300mA, T j = 25°C 25 160 80 5 mV I O = 5 to 200mA, T j = 25°C 10 mV Bias current Bias current fluctuation to input Bias current fluctuation to load Output noise voltage I Bias T j = 25°C 3 mA ∆I Bias(IN) V I = −10.5 to −25V, T j = 25°C 0.5 0.1 mA ∆I Bias(L) I O = 5 to 200mA, T j = 25°C mA V no f = 10Hz to 100kHz 200 µV Ripple rejection ratio RR V I = − 11.5 to − 21.5V, I O = 50mA, 59 dB f = 120Hz Minimum input/output voltage difference Output short-circuit current Peak output current Output voltage temperature coefficient V DIF(min) I O = 200mA, T j = 25°C 1.1 10 500 V I O(Short) V I = −35V, T j = 25°C mA I O(Peak) T j = 25°C mA ∆V O /T a I O = 5mA − 0.6 mV/°C Note 1) The specified condition T j = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, V I = −14V, I O = 100mA, C I = 2µF, C O = 1µF and T j = 0 to 125°C 4 Note 1) The specified condition T j Voltage Regulators AN79Nxx Series Electrical Characteristics at T a = 25 C (continued) • AN79N09 ( − 9V type) Parameter Symbol Conditions Min Typ Max Unit Output voltage Output voltage tolerance V O T j = 25 ° C − 8.65 − 9 − 9.35 V V O V I = − 11.5 to − 26V, I O = 5 to 200mA − 8.55 − 9.45 V Line regulation REG IN V I = −11.5 to −26V, T j = 25°C 14 80 mV V I = −12 to −22V, T j = 25°C 9 50 mV Load regulation REG L I O = 1 to 300mA, T j = 25°C 25 180 90 5 mV I O = 5 to 200mA, T j = 25°C 10 mV Bias current Bias current fluctuation to input Bias current fluctuation to load Output noise voltage I Bias T j = 25°C 3 mA ∆I Bias(IN) V I = −11.5 to −26V, T j = 25°C 0.5 0.1 mA ∆I Bias(L) I O = 5 to 200mA, T j = 25°C mA V no f = 10Hz to 100kHz 225 µV Ripple rejection ratio RR V I = − 12 to − 22V, I O = 50mA, 58 dB f = 120Hz Minimum input/output voltage difference Output short-circuit current Peak output current Output voltage temperature coefficient V DIF(min) I O = 200mA, T j = 25°C 1.1 10 500 V I O(Short) V I = −35V, T j = 25°C mA I O(Peak) T j = 25°C mA ∆V O /T a I O = 5mA − 0.6 mV/°C Note 1) The specified condition T j = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, V I = −15V, I O = 100mA, C I = 2µF, C O = 1µF and T j = 0 to 125°C • AN79N10 ( − 10V type) Parameter Symbol Conditions Min Typ Max Unit Output voltage Output voltage tolerance V O T j = 25 ° C −9.6 − −10 −10.4 V V O V I = − 12.5 to − 27V, I O = 5 to 200mA 9.5 − 10.5 V Line regulation REG IN V I = −12.5 to −27V, T j = 25°C 15 80 mV V I = −13 to −23V, T j = 25°C 10 50 mV Load regulation REG L I O = 1 to 300mA, T j = 25°C 25 200 100 5 mV I O = 5 to 200mA, T j = 25°C 10 mV Bias current Bias current fluctuation to input Bias current fluctuation to load Output noise voltage I Bias T j = 25°C 3.0 mA ∆I Bias(IN) V I = −12.5 to −27V, T j = 25°C 0.5 0.1 mA ∆I Bias(L) I O = 5 to 200mA, T j = 25°C mA V no f = 10Hz to 100kHz 250 µV Ripple rejection ratio RR V I = − 13 to − 23V, I O = 50mA, 58 dB f = 120Hz Minimum input/output voltage difference Output short-circuit current Peak output current Output voltage temperature coefficient V DIF(min) I O = 200mA, T j = 25°C 1.1 10 500 V I O(Short) V I = −35V, T j = 25°C mA I O(Peak) T j = 25°C mA ∆V O /T a I O = 5mA − 0.7 mV/°C Note 1) The specified condition T j = 25°C means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. Note 2) Unless otherwise specified, V I = −16V, I O = 100mA, C I = 2µF, C O = 1µF and T j = 0 to 125°C 5 ° [ Pobierz całość w formacie PDF ] |
Podobne
|